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TECHNIQUES USED IN ELECTRON
MICROSCOPY AND DIFFRACTION
Many different techniques can be used to obtain information about a sample in an electron microscope at scales ranging
from the micron to less than an Angstrom. This page provides some brief information about the main ones.
Diffraction Techniques
- Selected Area Diffraction
- Nanodiffraction
- Convergent Beam Electron Diffraction
- Precession Electron
Diffraction
This is a relatively new technique which reduces the effects of dynamical diffraction giving a
much easier to interpret diffraction pattern
- Diffraction from Beam Sensitive Materials
- Transmission Diffraction from a Surface
- Reflection Electron Diffraction
This techniques bounces a beam off a surface. It is commonly used to monitor thin films during growth.
- Low Energy Electron Diffraction (LEED)
- Diffractive Imaging
Conventional Imaging Techniques
- Bright Field Imaging
In the bright field (BF) mode, an aperture is placed in the back focal plane of the objective lens which
allows only the direct beam to pass.
- Dark Field Imaging
In dark field (DF) images, one or more diffracted beams are allowed to pass the objective aperture.
- Imaging Defects: g.b methods
High Resolution Imaging
- Conventional High Resolution Imaging
- Z-constrast Imaging in a STEM
- High Resolution Dark Field Imaging
- Aberration Corrected Microscopy
- Cryomicroscopy
Time Resolved Microscopy
Theory
- Direct Methods with Electrons
- Basics of Kinematical Diffraction
- Basics of Dynamical Diffraction
- Electron Channelling
- Imaging Theory
- Electron Energy Loss
- X-ray Emission