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Members of the Commission have been involved with the organization of several conference sessions related to electron diffraction. In particular, there were two relevant sessions at the 14th International Congress on Electron Microscopy in Cancun, Mexico, in August/September. One of these, on Electron Crystallography, was organized by S. Hovm÷ller, the other, on Convergent-Beam Electron Diffraction, had an invited talk by J. W. Steeds.
J. W. STEEDS, Chair