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Angle-Integrated Intensities. Electron Precession Cameras, Electron diffractometry

See: R. Vincent & P.A. Midgley (1994) Ultramicroscopy 53 (19949271-282.

B.S. Berg, et al Ultramicroscopy 1998 (74), 147 - 157.
J. Gjønnes et al Acta Cryst. 1998 (A54), 306 - 319.

A. Avilov et al. J. Appl Cryst. 1999 (32) 1033-1038

R. Vincent: http://www.phy.bris.ac.uk/research/microstructures/index.html

J. Gjonnes: jon.gjonnes@fys.uio.no

L. D. Marks: http://www.numis.northwestern.edu/Research/Faculty/faculty.shtml

D.L. Dorset: dldorset@erenj.com

W. Sinkler: http://www.numis.northwestern.edu/internet/Staff/wharton/

A. Avilov avilov@ns.crys.ras.ru