1. UHV-HREM and Chemical Analysis of Room Temperature Au Deposition on Si (001)-2x1
    E. Landree, D. Grozea, C. Callazo-Davila and L. D. Marks
    Physical Review B55, 7910 (1997)
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  2. An Investigation of the ESD O/O+ Ratio from V2O5 and Oxidized V
    M. Jacoby, F. J. Northrup, P. C. Stair, E. Weitz and L. D. Marks
    Applied Surface Science 108, 23 (1997)
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  3. Computer simulations of interactions between ultrafine alumina particles produced by an arc discharge
    M. H. Teng, L. D. Marks and D. L. Johnson
    Journal of Matererials Research 12, 235 (1997)
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  4. Imaging Surface Structures by Direct Phasing
    L. D. Marks, R. Plass and D. L. Dorset
    Surface Reviews and Letters 4, 1 (1997)

  5. Submonolayer Au on Si (111) Phase Diagram
    R. Plass and L. D. Marks
    Surface Science 380, 497 (1997)
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  6. Transmission Electron Diffraction Determination of the Ge (001)-2x1 Surface Structure
    C. Collazo-Davila, D. Grozea, E. Landree and L. D. Marks
    Surface Science 375, 293 (1997)
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  7. Direct Solutions of the Si (111) 7x7 Structure
    C.J. Gilmore, L. D. Marks, D. Grozea, C. Collazo, E. Landree and R. D. Twesten
    Surface Science 381, 77 (1997)
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  8. Atomic Structure of the In on Si (111) 4x1 Surface
    C. Collazo-Davila, L. D. Marks, K. Nishii and Y. Tanishiro
    Surface Review and Letters 4, 1 (1997)

  9. New Methods of Imaging Surfaces (and Buried Interfaces)
    L. D. Marks, E. Bengu and C. J. Gilmore
    Journal of Electron. Microscopy 46, 207 (1997)

  10. Structure and Superconductivity in Cr-Substituted HgBa2CuO4+d
    O. Chmaissem, J. D. Jorgensen, D. G. Hinks, B. G. Storey, B. Dabrowski, H. Zhang and
    L. D. Marks
    Physica C 279, 1 (1997)
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  11. Surface roughening by electron beam heating
    D. Grozea, E. Landree and L. D. Marks
    Applied Physical Letters 71, 2301 (1997)
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  12. A Genetic Algorithm Approach to Surface Structure Determination Using Direct Methods
    E. Landree, C. Collazo-Davila and L. D. Marks
    Acta. Crystallographica B53, 916 (1997)
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  13. Genesis of superconductivity in the layered cuprates: (ACuO2.5)2(ATiO3 )m ; 2<m<4
    P. A. Salvador, K. D. Otzschi, H. Zhang, B. Dabrowski, J. D. Jorgensen, T. O. Mason,
    L. D. Marks and K. R. Poeppelmeier KR
    Physica C 282, 959 (1997)
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