1. Structural investigations of metal-semiconductor surfaces

    2. D. Grozea, E. Landree, C. Collazo-Davila, E. Bengu, R. Plass and L. D. Marks
    Micron 30, 41 (1999)
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  2. Dynamical Direct Methods for Everyone

    3. W. Sinkler and L. D. Marks
    Ultramicroscopy 75, 251 (1999)
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  3. A Simple Channeling Model for HREM Contrast Transfer Under Dynamical Conditions

    4. W. Sinkler and L. D. Marks
    Journal of Microscopy 194,112 (1999)
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  4. Determination of the current density distribution in Josephson junctions

    5. M. Carmody, E. Landree, L.D. Marks and K. Merkle
    Physica C 315, 145 (1999)
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  5. Nucleation of Cubic Boron Nitride Thin Films

    6. C. Collazo-Davila, E. Bengu, L. D. Marks and M. Kirk
    Diamond and Related Materials 88, 1091 (1999)
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  6. A General Solution for 3-D Surface Structures Using Direct Methods

    7. L. D. Marks
    Physical Review B 60, 2771 (1999)
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  7. A Feasible Set Approach to the Crystallographic Phase Problem

    8. L. D. Marks, W. Sinkler and E. Landree
    Acta Crystallographica A55, 601 (1999)
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  8. Electron Crystallography in Surface Structure Analysis

    9. C. Leslie, E. Landree, C. Collazo-Davila, E. Bengu, D. Grozea and L. D. Marks
    Microscopy Research and Technique 3, 160 (1999)
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  9. Application of Direct Methods for Crystal Structure Determination Using Strongly Dynamical Bulk Electron Diffraction

    10. W. Sinkler and L. D. Marks
    Materials Characterization 42, 283 (1999)
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  10. High Temperature Electrical Property and Defect Analysis of the Quintuple Perovskite Layered Cuprates Eu2CaBa2Cu2Ti3O14 and LaYCaBa2Cu2+xTi3-xO14-y

    11. M. H. Kane, T. O. Mason, W. Sinkler, L. D. Marks, K. D. Otzschi, D. Ko and K. R. Poeppelmeier
    Journal of Solid State Chemistry 148, 3 (1999)
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  11. Structure Determination of the Ge(111)-(3X1)Ag Surface Reconstruction

    12. Grozea D; Bengu E; Collazo-Davila C and L. D. Marks
    Surface Review and Letters 6, 6, 1061 (1999)
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  12. Phase Transformation of AlN in AlN VN Superlattice

    13. Q Li, S. A. Barnett and L. D. Marks
    Scanning 21, 2, 158 (1999)
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