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UHV H-9000 TEM

UHV H-9000 TEM

The Hitachi UHV-H9000 High-Resolution Electron Microscope is the first conventional transmission instrument to achieve routine operation at mid-10-11 torr. Sample contamination is minimal, which is especially crucial in surface studies.

This custom-made microscope is equipped with a Gatan Parallel EELS and CCD Camera, both interfaced to computers. Routinely the instrument will attain resolutions of ~0.18 nm for bulk spacings and ~0.25 nm for the atomic-scale structure determination in surfaces.

Moreover, the UHV-H9000 is interfaced to the unique SPEAR system, which allows for preparation, treatment and characterization of samples in UHV without ever having to expose them to air.

Some Examples of Results under UHV conditions

High resolution micrograph <br> of hexagonal BN.
High resolution micrograph
of hexagonal BN. 		Individual Ag particles <br> on Si(100) surface
Individual Ag particles
on Si(100) surface 		Phase map of <br> Ag on Si(100) surface
Phase map of
Ag on Si(100) surface 		High resolution micrograph of <br> Si(111) 5x2 Au reconstruction
High resolution micrograph of
Si(111) 5x2 Au reconstruction
Nanoarches of <br> hexagonal BN
Nanoarches of
hexagonal BN 		Diffraction pattern of <br> Ge(111)-4x4 Ag reconstruction
Diffraction pattern of
Ge(111)-4x4 Ag reconstruction 		Diffraction pattern of Ag <br> on Si(100) surface
Diffraction pattern of Ag
on Si(100) surface 		Diffraction pattern of <br> Si(111) 5x2 Au reconstrution
Diffraction pattern of
Si(111) 5x2 Au reconstrution

(Click to enlarge)